Invention Grant
- Patent Title: Dual channel detector with different measurement signals
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Application No.: US17639725Application Date: 2020-11-18
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Publication No.: US12078512B2Publication Date: 2024-09-03
- Inventor: Sandro Kappert , Stefan Sax
- Applicant: TDK Electronics AG
- Applicant Address: DE Munich
- Assignee: TDK ELECTRONICS AG
- Current Assignee: TDK ELECTRONICS AG
- Current Assignee Address: DE Müchen
- Agency: Nixon Peabody LLP
- Priority: DE 2019132356.8 2019.11.28
- International Application: PCT/EP2020/082558 2020.11.18
- International Announcement: WO2021/104967A 2021.06.03
- Date entered country: 2022-03-02
- Main IPC: G01D3/08
- IPC: G01D3/08 ; G01L1/16

Abstract:
A dual channel detector. The first channel includes a first sensor and the second channel includes a second sensor, which are deposited on a substrate. The first and second sensors measure the same physical quantity, but output different measurement signals. The sensors are connected to evaluation units via contact points.
Public/Granted literature
- US20220291017A1 DUAL CHANNEL DETECTOR Public/Granted day:2022-09-15
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