Invention Grant
- Patent Title: Microparticle measurement device, microparticle sorting device, microparticle measurement system, and microparticle sorting system
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Application No.: US17433740Application Date: 2020-01-16
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Publication No.: US12078586B2Publication Date: 2024-09-03
- Inventor: Yoshiki Okamoto
- Applicant: SONY GROUP CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SONY GROUP CORPORATION
- Current Assignee: SONY GROUP CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: CHIP LAW GROUP
- Priority: JP 19040421 2019.03.06
- International Application: PCT/JP2020/001207 2020.01.16
- International Announcement: WO2020/179237A 2020.09.10
- Date entered country: 2021-08-25
- Main IPC: G01N15/1434
- IPC: G01N15/1434 ; G01N15/14 ; G01N15/149 ; G02B3/00 ; G02B13/14

Abstract:
To provide a microparticle measurement technology capable of supporting excitation light in a wideband wavelength range.
The present technology provides a microparticle measurement device provided with a plurality of objective lenses for excitation light irradiation used for irradiating microparticles flowing through a flow path with excitation light, in which at least one of the objective lenses for excitation light irradiation is used for detecting scattered light emitted from the microparticles by the excitation light with which the microparticles are irradiated through another one of the objective lenses for excitation light irradiation.
The present technology provides a microparticle measurement device provided with a plurality of objective lenses for excitation light irradiation used for irradiating microparticles flowing through a flow path with excitation light, in which at least one of the objective lenses for excitation light irradiation is used for detecting scattered light emitted from the microparticles by the excitation light with which the microparticles are irradiated through another one of the objective lenses for excitation light irradiation.
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