Invention Grant
- Patent Title: Method of detecting failure of antiparallel thyristor, and power control device
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Application No.: US17949363Application Date: 2022-09-21
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Publication No.: US12078670B2Publication Date: 2024-09-03
- Inventor: Takashi Ogino
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 21158164 2021.09.28
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H05B1/02

Abstract:
A method of detecting a failure of an antiparallel thyristor, wherein the antiparallel thyristor includes a first thyristor and a second thyristor connected in parallel and in opposite directions, and is configured to control power supplied from an alternating current power supply to a load, the method including: detecting, as a first detection value, a voltage or a current supplied to the load when ceasing an output command for the second thyristor and issuing an output command for the first thyristor; detecting, as a second detection value, the voltage or the current supplied to the load when ceasing the output command for the first thyristor and issuing the output command for the second thyristor; and determining the failure of the antiparallel thyristor based on a difference between the first detection value and the second detection value.
Public/Granted literature
- US20230100212A1 METHOD OF DETECTING FAILURE OF ANTIPARALLEL THYRISTOR, AND POWER CONTROL DEVICE Public/Granted day:2023-03-30
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