The present disclosure provides a method and an apparatus of testing a circuit, and a storage medium. The method of testing a circuit includes: determining a preset circuit module in a to-be-tested circuit and a preset node in the preset circuit module; inputting a test signal to an input terminal of the to-be-tested circuit according to a preset input rule, and obtaining a signal of the preset node in the preset circuit module; and determining a status of the preset circuit module based on the obtained signal of the preset node.