Invention Grant
- Patent Title: Temperature abnormality detection circuit device
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Application No.: US17969076Application Date: 2022-10-19
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Publication No.: US12079056B2Publication Date: 2024-09-03
- Inventor: Makoto Katase
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JP 21172193 2021.10.21
- Main IPC: G06F1/00
- IPC: G06F1/00 ; G06F1/20 ; G06F1/3206

Abstract:
A circuit device includes: a plurality of circuit blocks, each circuit block being provided with at least one temperature sensor; and a control circuit controlling the plurality of circuit blocks. Each circuit block performs first feedback control for temperature abnormality detection, based on a temperature detection value of the temperature sensor provided in each circuit block. The control circuit performs second feedback control for temperature abnormality detection to each circuit block of the plurality of circuit blocks, based on the temperature detection value of the temperature sensor.
Public/Granted literature
- US20230130982A1 CIRCUIT DEVICE AND PROCESSING SYSTEM Public/Granted day:2023-04-27
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