Invention Grant
- Patent Title: Degradation detection system
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Application No.: US17214274Application Date: 2021-03-26
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Publication No.: US12079303B2Publication Date: 2024-09-03
- Inventor: Yuichi Wakabayashi , Koji Wakimoto , Izumi Otsuka , Chikato Ishitobi , Takehisa Haraguchi
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: BIRCH, STEWART, KOLASCH & BIRCH, LLP
- Priority: JP 18186643 2018.10.01
- Main IPC: G06F17/15
- IPC: G06F17/15 ; G06F17/18 ; G06F18/2132 ; G08B21/18

Abstract:
There are included a normal model building unit that builds a normal model of another device on the basis of normal data of the other device; a degradation determination model building unit that builds a degradation determination model of the other device on the basis of the normal data and degradation data of the other device; a normal model rebuilding unit that builds a normal model of a target device on the basis of the normal model of the other device and normal data of the target device; a degradation determination model rebuilding unit that builds a degradation determination model of the target device on the basis of the degradation determination model of the other device and the normal model of the target device; and a degradation determining unit that determines degradation of the target device on the basis of operation data of the target device and the degradation determination model of the target device.
Public/Granted literature
- US20210216609A1 DEGRADATION DETECTION SYSTEM Public/Granted day:2021-07-15
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