Invention Grant
- Patent Title: Memory device and operating method using application of pass voltage according to program loops
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Application No.: US17833114Application Date: 2022-06-06
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Publication No.: US12080357B2Publication Date: 2024-09-03
- Inventor: Han Soo Joo
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: WILLIAM PARK & ASSOCIATES LTD.
- Priority: KR 20220017783 2022.02.10
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/10 ; G11C16/34

Abstract:
According to an embodiment of the present disclosure, a memory device, a peripheral circuit configured to perform a program operation, including a plurality of program loops, and a control logic configured to, in some of the plurality of loops of the program operation, control the peripheral circuit to apply a program voltage to a selected word line, apply a first pass voltage to adjacent word lines that are adjacent to the selected word line, and then apply a second pass voltage to adjacent word lines at a predetermined time point, wherein the second pass voltage has a different magnitude compared to the first pass voltage, and in the rest of the plurality of loops of the program operation, control the peripheral circuit to apply the second pass voltage to the adjacent word lines at a time point that is different from the predetermined time point from a selected loop.
Public/Granted literature
- US20230307069A1 MEMORY DEVICE AND METHOD OF OPERATING THE SAME Public/Granted day:2023-09-28
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