Invention Grant
- Patent Title: Manufacturing method of semiconductor structure and semiconductor structure
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Application No.: US17454871Application Date: 2021-11-15
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Publication No.: US12080758B2Publication Date: 2024-09-03
- Inventor: Weichao Zhang
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN 2110291828.7 2021.03.18
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L21/02 ; H01L21/321 ; H01L21/764 ; H10B12/00

Abstract:
The present disclosure provides a manufacturing method of a semiconductor structure and a semiconductor structure. The manufacturing method of a semiconductor structure includes: providing a substrate, the substrate includes active regions and isolation regions, each of the isolation regions includes a first trench and an isolation layer formed in the first trench; removing part of the isolation layer to form first grooves; forming a first mask layer, the first mask layer covers upper surfaces of the active regions and fills the first grooves; planarizing the first mask layer, such that an upper surface of a portion of the first mask layer located above the active regions is flush with an upper surface of a portion of the first mask layer located above the isolation regions; removing part of the first mask layer, part of the isolation layer, and part of the substrate, to form second trenches and third trenches.
Public/Granted literature
- US20220302253A1 MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE Public/Granted day:2022-09-22
Information query
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