Invention Grant
- Patent Title: Structure for battery analysis and X-ray diffraction device
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Application No.: US17637982Application Date: 2020-03-30
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Publication No.: US12080858B2Publication Date: 2024-09-03
- Inventor: Koichiro Ito , Suguru Sasaki
- Applicant: RIGAKU CORPORATION
- Applicant Address: JP Akishima
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Akishima
- Agency: WHDA, LLP
- Priority: JP 19154312 2019.08.27
- International Application: PCT/JP2020/014523 2020.03.30
- International Announcement: WO2021/038943A 2021.03.04
- Date entered country: 2022-02-24
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N23/20041 ; H01M10/42 ; H01M10/0525
Abstract:
A structure for battery analysis of the present invention includes a pressurizing unit (30) having a pressurizing mechanism, and a pressure receiving unit (10) for receiving pressure acting on a sample battery (S), and pressurizes the sample battery (S) accommodated in a hollow portion of a battery accommodation unit (20) between the pressurizing unit (30) and the pressure receiving unit (10) to suppress expansion and contraction of the sample battery (S).
Public/Granted literature
- US20220278381A1 STRUCTURE FOR BATTERY ANALYSIS AND X-RAY DIFFRACTION DEVICE Public/Granted day:2022-09-01
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