Invention Grant
- Patent Title: Electrical pathway intermittent fault detection
-
Application No.: US17824324Application Date: 2022-05-25
-
Publication No.: US12081168B2Publication Date: 2024-09-03
- Inventor: Katherine Han , Jack Stewart , Hai-Yue Han
- Applicant: Maxeon Solar Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: MAXEON SOLAR PTE. LTD.
- Current Assignee: MAXEON SOLAR PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: GRASSO PLLC
- Main IPC: H02S50/10
- IPC: H02S50/10 ; G01R31/08 ; G01R31/11 ; H02S40/34

Abstract:
Testing to detect intermittent electrical pathways is described. Applied currents may be reversed to fully test all components of a workpiece. Various testing methodologies may be employed. These methodologies may include Time Domain Reflectometry (TDR), mechanical agitation, dark current/voltage testing, (dark IV), i.e., electrical testing of a workpiece using applied electricity, and thermographic imaging, e.g., infra-red thermal imaging. The sensed voltage during agitation may be compared to a benchmark voltage to determine whether or not an intermittent failure exists.
Public/Granted literature
- US20220286085A1 ELECTRICAL PATHWAY INTERMITTENT FAULT DETECTION Public/Granted day:2022-09-08
Information query