Invention Grant
- Patent Title: Beam failure detection reference signal for a secondary cell
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Application No.: US17028586Application Date: 2020-09-22
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Publication No.: US12082191B2Publication Date: 2024-09-03
- Inventor: Tianyang Bai , Yan Zhou , Kiran Venugopal , Jung Ho Ryu , Junyi Li , Tao Luo
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: QUALCOMM Incorporated
- Main IPC: H04W24/04
- IPC: H04W24/04 ; H04W72/20

Abstract:
Certain aspects of the present disclosure provide techniques for managing beam failure recovery operations. A method that may be performed by a user equipment (UE) generally includes determining at least one reference signal (RS) associated with a first cell that is configured without a control-resource set (CORESET). The method also includes monitoring the at least one RS associated with the first cell. The method further includes detecting a beam failure on the first cell based on the monitoring of the at least one RS.
Public/Granted literature
- US20210105759A1 BEAM FAILURE DETECTION REFERENCE SIGNAL FOR A SECONDARY CELL Public/Granted day:2021-04-08
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