Invention Grant
- Patent Title: Detector for a dark-field, phase-contrast and attenuation interferometric imaging system
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Application No.: US17765520Application Date: 2020-09-16
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Publication No.: US12082964B2Publication Date: 2024-09-10
- Inventor: Thomas Koehler , Herfried Karl Wieczorek , Gereon Vogtmeier
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: EP 200734 2019.10.01
- International Application: PCT/EP2020/075798 2020.09.16
- International Announcement: WO2021/063674A 2021.04.08
- Date entered country: 2022-03-31
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
A detector for a dark-field and/or phase-contrast interferometric imaging system comprises pixels, first detector arrays, second detector arrays, and a processor. For each pixel, each of the first and second detector arrays is configured to detect a cumulative charge associated with fingers of the respective detector array. For each pixel, the processor is configured to assign an X-ray interaction event to either the first detector array or the second detector array based on the detector array that has the highest cumulative charge.
Public/Granted literature
- US20220338827A1 DETECTOR FOR A DARK-FIELD, PHASE-CONTRAST AND ATTENUATION INTERFEROMETRIC IMAGING SYSTEM Public/Granted day:2022-10-27
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