Invention Grant
- Patent Title: Map generation device and map generation system
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Application No.: US17042940Application Date: 2018-06-12
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Publication No.: US12085395B2Publication Date: 2024-09-10
- Inventor: Masashi Watanabe , Katsuyuki Kamei , Hiroyuki Fujibayashi , Takeo Sakairi , Ken Shimazaki
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: XSENSUS LLP
- International Application: PCT/JP2018/022377 2018.06.12
- International Announcement: WO2019/239477A 2019.12.19
- Date entered country: 2020-09-29
- Main IPC: G01C21/32
- IPC: G01C21/32 ; G06F16/29 ; G09B29/00

Abstract:
A map generation device is configured to determine evaluation value of each of a plurality of evaluation items that serve as indices for evaluation the reliability of the positional information of the planimetric feature. The plurality of evaluation items include any of an error amount when arrangement of composing points of the planimetric feature is approximated, a parallelism between an arrangement direction of composing points of the planimetric feature and a movement trajectory of the measuring vehicle, a distance between a position indicated by the position information of the planimetric feature and a position of the measuring vehicle when the position of the planimetric feature is measured, an absolute value of reflection intensity of a position of the planimetric feature obtained from the measurement information or a difference between a position of the planimetric feature and surrounding reflection intensity of the planimetric feature, and so on.
Public/Granted literature
- US20210033406A1 MAP GENERATION DEVICE AND MAP GENERATION SYSTEM Public/Granted day:2021-02-04
Information query
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