Invention Grant
- Patent Title: Assessing the measurement quality of the sensor element for measuring an object temperature
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Application No.: US17755708Application Date: 2020-11-02
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Publication No.: US12085456B2Publication Date: 2024-09-10
- Inventor: Joachim Nurnus , Florian Krogmann
- Applicant: Innovative Sensor Technology IST AG
- Applicant Address: CH Ebnat-Kappel
- Assignee: Innovator Sensor Technology IST AG
- Current Assignee: Innovator Sensor Technology IST AG
- Current Assignee Address: CH Ebnat-Kappel
- Agency: Endress+Hauser (USA) Holding, Inc.
- Agent Christopher R. Powers
- Priority: DE 2019129820.2 2019.11.05
- International Application: PCT/EP2020/080641 2020.11.02
- International Announcement: WO2021/089460A 2021.05.14
- Date entered country: 2022-05-05
- Main IPC: G01K7/04
- IPC: G01K7/04 ; G01K1/143 ; G01K15/00

Abstract:
The present disclosure includes a sensor element for registering temperature of an object, which includes: a substrate, wherein the substrate includes a platform face, which defines a first plane; a temperature detector, which is applied on a first temperature plane on the substrate and which is embodied to register the temperature of the object, wherein the first temperature plane lies in the first plane or essentially in parallel with the first plane; at least one sensor applied on a first subregion of the substrate for determining a temperature difference within the first subregion; and a passivation, which is applied on the substrate and which covers the substrate, the temperature detector and the sensor for determining the temperature difference, as well as residing in a method for assessing measurement quality of a sensor element of the present disclosure.
Public/Granted literature
- US20220381622A1 ASSESSING THE MEASUREMENT QUALITY OF THE SENSOR ELEMENT FOR MEASURING AN OBJECT TEMPERATURE Public/Granted day:2022-12-01
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