- Patent Title: Method and system for universal calibration of devices under test
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Application No.: US17404974Application Date: 2021-08-17
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Publication No.: US12085468B2Publication Date: 2024-09-10
- Inventor: Michael J. Brown
- Applicant: Fluke Corporation
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Seed IP Law Group LLP
- Main IPC: G01L27/00
- IPC: G01L27/00 ; G01G23/01 ; G01L25/00

Abstract:
Methods and systems include a universal, device-agnostic calibration process in which measured indications output by a device under test (DUT) (or corrected or converted indications derived therefrom) may be compared with calibration thresholds for any type of DUT to be calibrated. A complete, universal, and extensible calibration process is thus achieved that is capable of accommodating routine and complex calibration scenarios alike. A common set of statistics may be generated for all devices to be calibrated, without regard to the particular device under test, and statistics of the common set of statistics may be evaluated to determine the calibration state of the DUT. Additionally, the methods and systems disclosed herein provide for generating a comprehensive set of measurement records that may include some or all original observations, calculations, corrections, conversions, environmental factors, and measurement results, e.g., according to a standard, which allows for step-by-step auditing of every measurement performed.
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