Invention Grant
- Patent Title: Probe element and probe unit
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Application No.: US17412014Application Date: 2021-08-25
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Publication No.: US12085586B2Publication Date: 2024-09-10
- Inventor: Jun Toda , Kiyoto Araki
- Applicant: Murata Manufacturing Co., Ltd.
- Applicant Address: JP Kyoto-fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Kyoto-fu
- Agency: Studebaker & Brackett PC
- Priority: JP 19034003 2019.02.27
- Main IPC: G01R1/067
- IPC: G01R1/067 ; H01R24/44 ; H01R103/00

Abstract:
A probe element includes a conduction pin, a cylindrical barrel, and a bushing. The barrel accommodates the conduction pin inside thereof such that the tip portion of the conduction pin is exposed to the outside. The bushing holds the conduction pin inside the barrel in a state in which the tip portion is movable, and has predetermined permittivity. The conduction pin includes a tip portion, an intermediate portion partially accommodating the tip portion, and a cylindrical socket portion coupled to the intermediate portion. A distance between the socket portion and the inner wall surface of the barrel, and a distance between the intermediate portion and the inner wall surface of the barrel in a direction orthogonal to an extending direction of the barrel are different from each other.
Public/Granted literature
- US20210382087A1 PROBE ELEMENT AND PROBE UNIT Public/Granted day:2021-12-09
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