Invention Grant
- Patent Title: Locating an error in a supply or signal line of a magnetic resonance system
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Application No.: US17606804Application Date: 2020-04-24
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Publication No.: US12085598B2Publication Date: 2024-09-10
- Inventor: Peter Vernickel , Oliver Lips
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP 171745 2019.04.30
- International Application: PCT/EP2020/061437 2020.04.24
- International Announcement: WO2020/221663A 2020.11.05
- Date entered country: 2021-10-27
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R33/36

Abstract:
The invention relates to the field of magnetic resonance, and in particular to determining a location of an error in a supply or signal line (12). Due to the rugged environment for MR systems (10) in hospitals supply or signal lines (12) of MR systems (10) are error prone. For serviceability and part replacement it is important to locate the error in the supply or signal line (12) or to identify the subunit (14, 16, 18, 20) of the supply or signal line (12) in which the error occurred. The basic idea of the invention is to use an additional impedance (24), that is coupled to the supply or signal line (12) of the MR system (10) in the region of interconnection (22) for locating the error in the supply or signal line (12). The additional impedance provides a reference impedance value. By measuring the impedance and comparing the measured impedance to the reference impedance value, the error in the supply or signal line (12) can be located. In one embodiment the additional impedance (24) is realized as additional capacitance and provided as a capacitor (28).
Public/Granted literature
- US20220206054A1 LOCATING AN ERROR IN A SUPPLY OR SIGNAL LINE OF A MAGNETIC RESONANCE SYSTEM Public/Granted day:2022-06-30
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