Embodiments of the present invention provide systems and methods for storing calibration data for a test system operable to test a device under test (DUT). The test system includes one or more channel modules and a device interface. A first part of the calibration data is stored on a non-volatile memory. The non-volatile memory can be disposed in different parts of the test system. The non-volatile memory is located on the device interface and can also be located on one or more of the channel modules, as well as an attachment of the test system. The non-volatile memory is associated with the one or more channel modules. The second part of the calibration data is stored on a non-volatile memory associated with the device-under-test interface.