Invention Grant
- Patent Title: Wall profile measurement apparatus
-
Application No.: US17655428Application Date: 2022-03-18
-
Publication No.: US12085633B2Publication Date: 2024-09-10
- Inventor: Naotsugu Shimizu
- Applicant: DENSO CORPORATION
- Applicant Address: JP Kariya
- Assignee: DENSO CORPORATION
- Current Assignee: DENSO CORPORATION
- Current Assignee Address: JP Kariya
- Agency: MASCHOFF BRENNAN
- Priority: JP 019170243 2019.09.19
- Main IPC: G01S13/46
- IPC: G01S13/46 ; B60Q9/00 ; G01S7/41 ; G01S13/89 ; G01S13/931

Abstract:
A measurement apparatus repeatedly executes measurement determination of whether measurement of a wall object has succeeded. If the wall-object measurement has succeeded, the measurement apparatus calculates an instantaneous wall-distance value indicative of a distance of the wall object from the own object. Otherwise, if the wall-object measurement has not succeeded, the measurement apparatus executes first extrapolation of an additional instantaneous wall-distance value. The measurement apparatus prevents an additional execution of the first extrapolation upon determination that the frequency of continuously repeated executions of the first extrapolation is not less than a prevention threshold frequency. The measurement apparatus sets, if the result of the measurement determination is correct, a correct-state threshold as the prevention threshold frequency, and sets, if the result of the measurement determination is incorrect, an incorrect-state threshold as the prevention threshold frequency; the incorrect-state threshold is smaller than the correct-state threshold.
Public/Granted literature
- US20220206134A1 WALL PROFILE MEASUREMENT APPARATUS Public/Granted day:2022-06-30
Information query