Invention Grant
- Patent Title: Machine learning based direct method of determining status of facility control loop components
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Application No.: US17361990Application Date: 2021-06-29
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Publication No.: US12085929B2Publication Date: 2024-09-10
- Inventor: Sanjay Kantilal Dave , Akanksha Jain , Viraj Srivastava , Vijoy Akavalappil
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NC Charlotte
- Agency: Alston & Bird LLP
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06N3/049 ; G06N3/08

Abstract:
A trained machine learning algorithm processes time series production data. The time series production data are representative of a control process within a facility control loop. The machine learning training algorithm is trained using positive training data that are representative of a normal operation of components within the facility control loop and negative training data that are representative of an abnormal operation of components within the facility control loop. Output of the trained machine learning algorithm identifies abnormalities in the facility control loop.
Public/Granted literature
- US20210405631A1 Machine Learning Based Direct Method of Determining Status of Facility Control Loop Components Public/Granted day:2021-12-30
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