An inspection-plan based inspection method includes receiving data characterizing an inspection plan associated with inspection of one or more nodes in an inspection site by an inspection device. A first step of the inspection plan includes a first set of operating parameters of the inspection device associated with the inspection of a first node of the one or more nodes and a first set of constraints associated with one or more inspection criteria at the first node by the inspection device. The method also includes generating a first control signal configured to instruct the inspection device to inspect the first node of the one or more nodes. The first control signal is based on one or more of the first set of operating parameters and a user input. The method further includes receiving data characterizing the inspection measurement of the first node by the inspection device.