Invention Grant
- Patent Title: Through substrate via structure and manufacturing method thereof, redistribution layer structure and manufacturing method thereof
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Application No.: US17321536Application Date: 2021-05-17
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Publication No.: US12087665B2Publication Date: 2024-09-10
- Inventor: Wei-Lan Chiu , Hsiang-Hung Chang
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW 0109308 2021.03.16
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768

Abstract:
A through substrate via structure and a manufacturing method thereof, and a redistribution layer structure and a manufacturing method thereof are provided. The through substrate via structure includes a columnar conductive layer and a nanotwinned metal film disposed at least around the conductive layer. In a cross-section of the through substrate via structure, relative to a total area of the conductive layer and the nanotwinned metal film, an area ratio of the nanotwinned metal film is 50% or less by area.
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