- Patent Title: Display module evaluation jig and display module evaluation method
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Application No.: US17532281Application Date: 2021-11-22
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Publication No.: US12092617B2Publication Date: 2024-09-17
- Inventor: Gabtae Kim
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-Si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: CANTOR COLBURN LLP
- Priority: KR 20210039565 2021.03.26
- Main IPC: G01N3/303
- IPC: G01N3/303 ; G01M7/08 ; G01N3/02 ; G01N3/30

Abstract:
Disclosed are display module evaluation jigs and methods, The display module evaluation jig includes: a first body defining a plurality of first recessions on a top surface of the first body; a second body disposed on and combined with the first body; and a plurality of insertions on the first recessions and between the first body and the second body. Inner lateral surfaces of the first body are directed toward and spaced apart from lateral surfaces of the insertions. The inner lateral surfaces define the first recessions.
Public/Granted literature
- US20220307955A1 DISPLAY MODULE EVALUATION JIG AND DISPLAY MODULE EVALUATION METHOD Public/Granted day:2022-09-29
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