- Patent Title: Nitride-based semiconductor device and manufacturing method thereof
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Application No.: US17711062Application Date: 2022-04-01
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Publication No.: US12094713B2Publication Date: 2024-09-17
- Inventor: Qiyue Zhao , Chuan He
- Applicant: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Applicant Address: CN Zhuhai
- Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Current Assignee: INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Zhuhai
- Agency: McCoy Russell LLP
- Priority: CN 2010117937.2 2020.02.25
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/04 ; H01L21/265

Abstract:
A semiconductor device includes a doped substrate, a barrier layer, a channel layer, and a doped semiconductor structure. The barrier layer is disposed on the doped substrate. The channel layer is disposed between the doped substrate and the barrier layer, in which a bandgap of the barrier layer is greater than a bandgap of the channel layer. The doped semiconductor structure is embedded in the doped substrate and at a position lower than the channel layer, in which the doped substrate and the doped semiconductor structure have different polarities, so as to form a diode therebetween.
Public/Granted literature
- US20220223417A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2022-07-14
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