Invention Grant
- Patent Title: Method of generating abnormal state detection model
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Application No.: US17543141Application Date: 2021-12-06
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Publication No.: US12105073B2Publication Date: 2024-10-01
- Inventor: Won Keun Lee
- Applicant: MOVIC LAB INC.
- Applicant Address: KR Incheon
- Assignee: MOVIC LAB INC.
- Current Assignee: MOVIC LAB INC.
- Current Assignee Address: KR Incheon
- Agency: Studebaker & Brackett PC
- Priority: KR 20200141605 2020.10.28
- Main IPC: G01N33/00
- IPC: G01N33/00

Abstract:
A method for generating an abnormal state detection model, that includes: receiving first and second normal state signals detected, for a predetermined time by first and second sensors, respectively; generating a normal state data set based on the first and the second normal state signals; recognizing first and second variable values; generating a first abnormal state signal by applying the first variable value to an impulse function and a second abnormal state signal by applying the second variable value to a Gaussian distribution function; generating an abnormal state data set based on the first and second abnormal state signals; generating a detection model learning set for generating an abnormal state detection model by combining the normal state data set and the abnormal state data set; and generating an abnormal state detection model based on the detection model learning set.
Public/Granted literature
- US20220128534A1 METHOD OF GENERATING ABNORMAL STATE DETECTION MODEL Public/Granted day:2022-04-28
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