Invention Grant
- Patent Title: Method for fabricating test socket
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Application No.: US17768763Application Date: 2021-05-18
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Publication No.: US12105133B2Publication Date: 2024-10-01
- Inventor: Seungha Baek
- Applicant: LEENO INDUSTRIAL INC.
- Applicant Address: KR Busan
- Assignee: LEENO INDUSTRIAL INC.
- Current Assignee: LEENO INDUSTRIAL INC.
- Current Assignee Address: KR Busan
- Agency: Sughrue Mion, PLLC
- Priority: KR 20200061448 2020.05.22
- International Application: PCT/KR2021/006236 2021.05.18
- International Announcement: WO2021/235842A 2021.11.25
- Date entered country: 2022-04-13
- Main IPC: G01R3/00
- IPC: G01R3/00 ; G01R1/04 ; G01R1/073

Abstract:
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a coupling block by joining an insulating member of an insulating material to one surface of a base member of a conductive material, forming a probe accommodating hole for accommodating the probe in the coupling block and a first support hole for supporting one end portion of the probe, forming a second support hole in a cover member of an insulating material for supporting the other end portion of the probe, inserting the probe into the probe accommodating hole so that the one end portion of the probe is supported by the first support hole, and joining the cover member to the other surface of the base member so that the other end portion of the probe is supported by the second support hole.
Public/Granted literature
- US20240110947A1 METHOD FOR FABRICATING TEST SOCKET Public/Granted day:2024-04-04
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