Invention Grant
- Patent Title: Configuration tool and method for a quality control system
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Application No.: US18318249Application Date: 2023-05-16
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Publication No.: US12118674B2Publication Date: 2024-10-15
- Inventor: Ives De Saeger
- Applicant: ARKITE NV
- Applicant Address: BE Genk
- Assignee: ARKITE NV
- Current Assignee: ARKITE NV
- Current Assignee Address: BE Genk
- Agency: Workman Nydegger
- Priority: EP 193384 2017.09.27
- Main IPC: G06T19/00
- IPC: G06T19/00 ; G01F15/075 ; G06F3/01 ; G06T15/08

Abstract:
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
Public/Granted literature
- US20230290074A1 CONFIGURATION TOOL AND METHOD FOR A QUALITY CONTROL SYSTEM Public/Granted day:2023-09-14
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