Invention Grant
- Patent Title: Inspection apparatus and measurement apparatus
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Application No.: US17749331Application Date: 2022-05-20
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Publication No.: US12125176B2Publication Date: 2024-10-22
- Inventor: Kosuke Fukuda , Masayoshi Ishikawa , Yasuhiro Yoshida , Hiroyuki Shindo
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: MATTINGLY & MALUR, PC
- Priority: JP 21107415 2021.06.29
- Main IPC: G06T5/70
- IPC: G06T5/70 ; G06T3/40 ; G06T7/00 ; G06T7/62

Abstract:
An inspection apparatus includes an image distortion estimation unit that estimates a distortion amount between a reference image and an inspection image, an image distortion correction unit that corrects the inspection image and/or the reference image using an estimated distortion amount, and an inspection unit that performs inspection using a corrected inspection image and the reference image or the inspection image and a corrected reference image. The image distortion estimation unit estimates a distortion amount in which only distortion occurring in an entire image can be corrected by adjustment of a correction condition.
Public/Granted literature
- US20220414833A1 INSPECTION APPARATUS AND MEASUREMENT APPARATUS Public/Granted day:2022-12-29
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