Invention Grant
- Patent Title: Electron microscopy grid
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Application No.: US17431849Application Date: 2020-02-25
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Publication No.: US12125668B2Publication Date: 2024-10-22
- Inventor: Wouter Van Putte , Jean-Pierre Timmermans , Jan Vanfleteren
- Applicant: UNIVERSITEIT ANTWERPEN , IMEC VZW , UNIVERSITEIT GENT
- Applicant Address: BE Antwerp
- Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW,UNIVERSITEIT GENT
- Current Assignee: UNIVERSITEIT ANTWERPEN,IMEC VZW,UNIVERSITEIT GENT
- Current Assignee Address: BE Antwerp; BE Leuven; BE Ghent
- Agency: Workman Nydegger
- Priority: EP 158982 2019.02.25
- International Application: PCT/EP2020/054930 2020.02.25
- International Announcement: WO2020/173952A 2020.09.03
- Date entered country: 2021-08-18
- Main IPC: H01J37/26
- IPC: H01J37/26 ; B01J19/00

Abstract:
An electron microscopy grid, includes: (i) a perforated substrate, (ii) a support film on the perforated substrate, the support film having a thickness of 60 Å or less, and (iii) linkers attached on top of the support film. The linkers has at least one affinity group for immobilizing an analyte; wherein the linkers form a non-random pattern on the support film.
Public/Granted literature
- US20220157559A1 ELECTRON MICROSCOPY GRID Public/Granted day:2022-05-19
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