Invention Grant
- Patent Title: Vertical memory device with a double word line structure
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Application No.: US17968082Application Date: 2022-10-18
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Publication No.: US12131774B2Publication Date: 2024-10-29
- Inventor: Seung-Hwan Kim , Su-Ock Chung , Seon-Yong Cha
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T GROUP LLP
- Priority: KR 20190024083 2019.02.28
- Main IPC: G11C11/4097
- IPC: G11C11/4097 ; G11C7/18 ; G11C11/401 ; H10B12/00

Abstract:
A memory device includes: a substrate; a bit line which is vertically oriented from the substrate; a plate line which is vertically oriented from the substrate; and a memory cell provided with a transistor and a capacitor that are positioned in a lateral arrangement between the bit line and the plate line, wherein the transistor includes: an active layer which is laterally oriented to be parallel to the substrate between the bit line and the capacitor; and a line-shaped lower word line and a line-shaped upper word line vertically stacked with the active layer therebetween and oriented to intersect with the active layer.
Public/Granted literature
- US20230045324A1 VERTICAL MEMORY DEVICE WITH A DOUBLE WORD LINE STRUCTURE Public/Granted day:2023-02-09
Information query
IPC分类: