Invention Grant
- Patent Title: X-ray imaging apparatus
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Application No.: US17629070Application Date: 2020-05-07
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Publication No.: US12133750B2Publication Date: 2024-11-05
- Inventor: Hidetaka Takezawa
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JP2019-150679 20190820
- International Application: PCT/JP2020/018557 WO 20200507
- International Announcement: WO2021/033370 WO 20210225
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/04

Abstract:
The X-ray imaging apparatus (100) is provided with an imaging unit (2), a moving mechanism (4), and an image processing unit (17) for generating a subject image (42). The image processing unit is configured to set a reference plane (34) that is an imaging region when generating a subject image and generate the subject image on the reference plane. In a case where there is a plurality of X-ray images in which pixel corresponding points are reflected, the image processing unit is configured to select the pixels corresponding to the pixel corresponding points in the X-ray image in which the pixel corresponding points are reflected to determine pixel values of the pixel corresponding points.
Public/Granted literature
- US20220273251A1 X-RAY IMAGING APPARATUS Public/Granted day:2022-09-01
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