Invention Grant
- Patent Title: X-ray fluorescence analyzer
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Application No.: US17794855Application Date: 2020-10-15
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Publication No.: US12135299B2Publication Date: 2024-11-05
- Inventor: Takuro Izumi , Tetsuya Yoneda
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JP2020-010907 20200127
- International Application: PCT/JP2020/038875 WO 20201015
- International Announcement: WO2021/152928 WO 20210805
- Main IPC: G01N23/20008
- IPC: G01N23/20008 ; G01N23/207 ; G01N23/2209 ; G01N23/223

Abstract:
An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.
Public/Granted literature
- US20230057233A1 X-RAY FLUORESCENCE ANALYZER Public/Granted day:2023-02-23
Information query
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