A system for acquiring a test-and-measurement signal from a device under test (DUT) including a test-and-measurement probe, a user interface, a robot, and a controller. The probe is configured to acquire an electronic signal from the DUT. The user interface displays a digital representation of a physical electronic circuit of the DUT, including portrayals of virtual nodes that correspond to actual nodes on the DUT. The robot is configured to automatically position the probe with respect to the DUT. The controller is configured to receive from the user interface an electronic indication of a selected node of the digital representation of the physical electronic circuit, where the selected node is one of the virtual nodes. The controller is further configured to provide instructions to the robot to automatically position the probe to a position on the physical electronic circuit corresponding to the actual node.