- Patent Title: Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium
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Application No.: US17675851Application Date: 2022-02-18
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Publication No.: US12136238B2Publication Date: 2024-11-05
- Inventor: Nobukatsu Sugiyama , Junichiro Ooga , Yoshiyuki Ishihara , Junji Oaki , Hiroshi Ohno , Hideaki Okano , Hiroya Kano , Takahiro Kamikawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Priority: JP2021-144006 20210903
- Main IPC: G06T7/80
- IPC: G06T7/80 ; G06T7/00 ; G06T7/40 ; G06T7/50 ; G06T7/70 ; H04N7/18 ; H04N23/695

Abstract:
In an embodiment, a processing device relating to an inspection of an inspection object by a photography unit is provided. A processor of the processing device calculates a plurality of photography points as positions photographing the inspection object based on shape data in which a shape of a surface of the inspection object is indicated by a point group, and information relating to a position and a normal vector on the surface of the inspection object is defined by the point group. The processor executes analysis regarding a path that passes through all of the calculated photography points and minimizes a sum of a movement cost from each of the photography points to a photography point of a next movement destination, and calculates a path corresponding to an analysis result as a path for moving the photography unit.
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