Invention Grant
- Patent Title: Tracking the effects of voltage and temperature on a memory device using an internal oscillator
-
Application No.: US17831114Application Date: 2022-06-02
-
Publication No.: US12136467B2Publication Date: 2024-11-05
- Inventor: Keun soo Song
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sander LLP
- Main IPC: G11C7/04
- IPC: G11C7/04 ; G11C7/10 ; H03K19/21 ; H03L7/099
Abstract:
A first oscillator counter value is received at a first time, and a second oscillator counter value is received at a second time. The first time precedes the second time. The first oscillator count value is compared to the second oscillator count value. responsive to determining that the first oscillator count value and the oscillator second count value do not match, a propagation delay for performing write operations on a memory device is adjusted.
Public/Granted literature
- US20230395098A1 TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR Public/Granted day:2023-12-07
Information query
