Invention Grant
- Patent Title: Semiconductor device manufacturing method and semiconductor device manufacturing system
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Application No.: US17581990Application Date: 2022-01-24
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Publication No.: US12136569B2Publication Date: 2024-11-05
- Inventor: Mitsuhiko Ogihara
- Applicant: FILNEX INC.
- Applicant Address: JP Tokyo
- Assignee: FILNEX INC.
- Current Assignee: FILNEX INC.
- Current Assignee Address: JP Tokyo
- Agency: HAUPTMAN HAM, LLP
- Priority: JP2019-138945 20190729
- Main IPC: H01L21/78
- IPC: H01L21/78 ; H01L21/67

Abstract:
A method for manufacturing a semiconductor device includes the steps of a first separation process of separating the semiconductor layer from the first substrate by bringing a pick-up substrate into close contact with the semiconductor layer and then moving the pick-up substrate away from the first substrate, pressing of pressing the semiconductor layer that is in close contact with the pick-up substrate to the second substrate, temperature maintenance of maintaining temperatures of contact surfaces of the semiconductor layer and the second substrate at a temperature higher than room temperature while pressing the semiconductor layer onto the second substrate, and a second separation process of separating the semiconductor layer from the pick-up substrate after the temperatures of the contact surfaces are maintained at the temperature higher than room temperature.
Public/Granted literature
- US20220148921A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM Public/Granted day:2022-05-12
Information query
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