Invention Grant
- Patent Title: Method for manufacturing semiconductor structure having a porous structure
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Application No.: US17742612Application Date: 2022-05-12
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Publication No.: US12136592B2Publication Date: 2024-11-05
- Inventor: Tse-Yao Huang
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/00

Abstract:
The present application provides a method of manufacturing a semiconductor structure. The method includes: forming a dielectric layer over a substrate; forming an opening in the dielectric layer; forming a first liner conformal to the opening; forming a porous layer in the opening and surrounded by the first liner; forming a conductive via penetrating the dielectric layer; and forming a conductive pad over the dielectric layer, wherein the conductive pad covers the porous layer and the conductive via.
Public/Granted literature
- US20230369202A1 METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE HAVING A POROUS STRUCTURE Public/Granted day:2023-11-16
Information query
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