- Patent Title: Three-dimensional memory devices and fabricating methods thereof
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Application No.: US17591429Application Date: 2022-02-02
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Publication No.: US12136599B2Publication Date: 2024-11-05
- Inventor: He Chen , Shu Wu , Zhen Pan , Siping Hu , Yi Zhao , Ziqun Hua
- Applicant: Yangtze Memory Technologies Co., Ltd.
- Applicant Address: CN Hubei
- Assignee: Yangtze Memory Technologies Co., Ltd.
- Current Assignee: Yangtze Memory Technologies Co., Ltd.
- Current Assignee Address: CN Hubei
- Agency: Conley Rose, P.C.
- Priority: CN202110142144.0 20210202
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L23/00 ; H01L23/535 ; H01L23/58 ; H01L25/00 ; H01L25/065 ; H01L25/18

Abstract:
Disclosed are three-dimensional (3D) memory devices and fabricating methods thereof. In some embodiments, a disclosed memory device comprises a wafer structure having a sealing region and a chip region. The wafer structure comprises a substrate, a memory string array on a first side of the substrate in the chip region, a first protection structure and a second protection structure on the first side of the substrate in the sealing region, and a first contact and a second contact extending through the substrate in the sealing region. The first contact is in contact with the first protection structure, and the second contact is in contact with the second protection structure.
Public/Granted literature
- US20220246544A1 THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF Public/Granted day:2022-08-04
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