Invention Grant
- Patent Title: Methods of manufacturing three-dimensional integrated circuit structures
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Application No.: US17578477Application Date: 2022-01-19
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Publication No.: US12136619B2Publication Date: 2024-11-05
- Inventor: Hsien-Wei Chen , Ming-Fa Chen , Sung-Feng Yeh
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/02 ; H01L23/31 ; H01L25/00 ; H01L25/065 ; H01L21/56 ; H01L23/00 ; H01L23/48

Abstract:
A method of manufacturing a three-dimensional integrated circuit structure includes the following steps. A first die is provided. A plurality of second dies are bonded onto the first die, wherein a gap is formed between the plurality of second dies. A dielectric material is filled in the gap by performing at least one cycle of: by a first deposition process, forming a first dielectric layer having a smaller thickness at a top portion of a sidewall of the gap than a bottom portion of the sidewall of the gap; and by a second deposition process, forming a second dielectric layer on the first dielectric layer over the gap. A portion of the dielectric material is removed to form a dielectric structure between the plurality of second dies, wherein a top surface of the dielectric structure is substantially coplanar with tops surfaces of the plurality of second dies.
Public/Granted literature
- US20220139898A1 METHODS OF MANUFACTURING THREE-DIMENSIONAL INTEGRATED CIRCUIT STRUCTURES Public/Granted day:2022-05-05
Information query
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