- Patent Title: Methods and systems for monitoring events related to X-ray tubes
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Application No.: US17165388Application Date: 2021-02-02
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Publication No.: US12137512B2Publication Date: 2024-11-05
- Inventor: Munish Vishwas Inamdar , Kiran Panchal , Rui Xu , Uwe Wiedmann
- Applicant: GE PRECISION HEALTHCARE LLC
- Applicant Address: US WI Wauwatosa
- Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee: GE PRECISION HEALTHCARE LLC
- Current Assignee Address: US WI Wauwatosa
- Main IPC: G06F17/18
- IPC: G06F17/18 ; A61B6/58 ; G16H40/40 ; G16H40/63 ; H05G1/54 ; A61B6/03 ; G01N23/046

Abstract:
The present approach relates to generating one or both of a failure prediction indication for an X-ray tube or a remaining useful life estimate for the X-ray tube. In one implementation, a complexity of a regression model is selected based on the operating points utilized by an imaging system for the X-ray tube, where the regression model estimates coefficients utilized by a static tube model in estimating health (e.g., thickness) of the electron emitter of the X-ray tube, which in turn may be used in predicting remaining useful life of an electron emitter of the X-ray tube. In another implementation, replacement of an X-ray tube or a component of a filament drive circuit coupled to the X-ray tube may be detected.
Public/Granted literature
- US20220245482A1 METHODS AND SYSTEMS FOR MONITORING EVENTS RELATED TO X-RAY TUBES Public/Granted day:2022-08-04
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