- Patent Title: Semiconductor device having a thermal contact and method of making
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Application No.: US18447927Application Date: 2023-08-10
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Publication No.: US12142542B2Publication Date: 2024-11-12
- Inventor: Jian Wu , Feng Han , Shuai Zhang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. , TSMC CHINA COMPANY, LIMITED
- Applicant Address: TW Hsinchu; CN Shanghai
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,TSMC CHINA COMPANY, LIMITED
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,TSMC CHINA COMPANY, LIMITED
- Current Assignee Address: TW Hsinchu; CN Shanghai
- Agency: Hauptman Ham, LLP
- Priority: CN202011306929.9 20201120
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L21/48 ; H01L23/36 ; H01L23/367 ; H01L27/12

Abstract:
An integrated circuit includes a substrate and a semiconductor material layer over the substrate. The integrated circuit includes a first source structure in the semiconductor material layer. The first source structure includes a first doped well. The integrated circuit includes a drain structure in the semiconductor material layer. The drain structure includes a second doped well. The integrated circuit includes a second source structure in the semiconductor material layer. The second source structure includes a third doped well. The drain structure is between the first source structure and the second source structure. The integrated circuit includes a first deep trench isolation (DTI) extending through the first doped well; and a first thermal contact extending through the first DTI. The thermal contact is in direct contact with the substrate. The first DTI is between the thermal contact and the first doped well.
Public/Granted literature
- US20230386958A1 SEMICONDUCTOR DEVICE HAVING A THERMAL CONTACT AND METHOD OF MAKING Public/Granted day:2023-11-30
Information query
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