Invention Grant
- Patent Title: Memory device and operating method of the memory device including detecting erase cell disturbance during programming
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Application No.: US17871251Application Date: 2022-07-22
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Publication No.: US12148485B2Publication Date: 2024-11-19
- Inventor: Soo Yeol Chai
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: WILLIAM PARK & ASSOCIATES LTD.
- Priority: KR10-2022-0009937 20220124
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/10 ; G11C16/26

Abstract:
A memory device may include a plurality of memory cells, a peripheral circuit configured to perform a plurality of program loops on selected memory cells among the plurality of memory cells, each of the plurality of program loops including a program pulse application operation and a program verify operation, and control logic configured to control the peripheral circuit to suspend an nth program loop (n is a natural number equal to or greater than 1) among the plurality of program loops in response to a suspend command received during the nth program loop, and to resume the nth program loop with a negative verify operation in response to a resume command. The negative verify operation applies a negative voltage having a voltage less than a state voltage at the time of application of the resume command.
Public/Granted literature
- US20230238065A1 MEMORY DEVICE AND OPERATING METHOD OF THE MEMORY DEVICE Public/Granted day:2023-07-27
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