Invention Grant
- Patent Title: Adjustable memory cell reliability management
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Application No.: US17861231Application Date: 2022-07-10
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Publication No.: US12154655B2Publication Date: 2024-11-26
- Inventor: Daniele Balluchi , Marco Sforzin
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C11/22
- IPC: G11C11/22 ; G06F11/07 ; G11C7/10 ; G11C7/12

Abstract:
Systems, apparatuses, and methods related to a flip-on-precharge disable operation are described herein. In an example, a method can include receiving a command to perform a precharge operation on a set of memory cells in a memory device. The memory device can include a plurality of sets of memory cells corresponding to respective portions of an array of memory cells of the memory device. The method can further include accessing one or more sets of bits in a mode register. The one or more sets of bits in the mode register indicate address locations of the plurality of sets of memory cells to disable the flip on precharge operation. The method can further include performing the precharge operation on the set of memory cells. The flip on precharge operation associated with the precharge operation can be disabled for those sets of the plurality of sets of memory cells whose address locations are in the mode register.
Public/Granted literature
- US20240013822A1 ADJUSTABLE MEMORY CELL RELIABILITY MANAGEMENT Public/Granted day:2024-01-11
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