Invention Grant
- Patent Title: Test jig, test device, and test method for secondary battery
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Application No.: US17485835Application Date: 2021-09-27
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Publication No.: US12159979B2Publication Date: 2024-12-03
- Inventor: Arata Okuyama , Takashi Kajihara
- Applicant: ESPEC CORP.
- Applicant Address: JP Osaka
- Assignee: ESPEC CORP.
- Current Assignee: ESPEC CORP.
- Current Assignee Address: JP Osaka
- Agency: Sughrue Mion, PLLC
- Priority: JP2020-164870 20200930
- Main IPC: H01M10/42
- IPC: H01M10/42 ; G01R31/392
Abstract:
There is provided a test device for a secondary battery, the test device including: a test jig including a nail portion configured to pierce the secondary battery and a heater configured to raise a temperature of the nail portion by being supplied with electric power; and a moving mechanism configured to move the nail portion toward the secondary battery.
Public/Granted literature
- US20220102768A1 TEST JIG, TEST DEVICE, AND TEST METHOD FOR SECONDARY BATTERY Public/Granted day:2022-03-31
Information query
