Invention Grant
- Patent Title: Quality factor estimation of an inductive element
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Application No.: US18154394Application Date: 2023-01-13
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Publication No.: US12160117B2Publication Date: 2024-12-03
- Inventor: Lionel Cimaz , Antonio Borrello , Simone Ludwig Dalla Stella
- Applicant: STMicroelectronics S.r.l. , STMicroelectronics (Grand Ouest) SAS
- Applicant Address: IT Agrate Brianza; FR Le Mans
- Assignee: STMicroelectronics S.r.l.,STMicroelectronics (Grand Ouest) SAS
- Current Assignee: STMicroelectronics S.r.l.,STMicroelectronics (Grand Ouest) SAS
- Current Assignee Address: IT Agrate Brianza; FR Le Mans
- Agency: Slater Matsil, LLP
- Priority: EP20305965 20200831
- Main IPC: H02J50/12
- IPC: H02J50/12 ; H04B5/24 ; H04B5/79

Abstract:
The present disclosure relates to a device comprising an inductive element and a first capacitive element series connected between a first node and a second node, a first MOS transistor connected between the first node and a third node configured to receive a reference potential, the second node being coupled directly or via a second MOS transistor to the third node, a second capacitive element connected between a fourth node and an interconnection node between the first capacitive element and the inductive element, a current generator configured to provide an AC current to the fourth node, and a switch connected between the fourth node and the third node.
Public/Granted literature
- US20230170742A1 QUALITY FACTOR ESTIMATION OF AN INDUCTIVE ELEMENT Public/Granted day:2023-06-01
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