Invention Grant
- Patent Title: Measurement apparatus, control method for measurement apparatus, and measurement system
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Application No.: US17738907Application Date: 2022-05-06
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Publication No.: US12160164B2Publication Date: 2024-12-03
- Inventor: Yu Tanaka
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. I.P. Division
- Priority: JP2021-086883 20210524
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G05F1/46 ; H02M1/00 ; H02M1/36 ; H02M3/156

Abstract:
A measurement apparatus includes a linear regulator, a switching regulator, an acquisition unit configured to acquire measurement data by sensing a signal as a measurement target, and a control unit configured to selectively drive the linear regulator or the switching regulator, wherein the control unit is configured to select and drive the linear regulator in a first period in which the measurement data is acquired by the acquisition unit, and select and drive the switching regulator in a second period that is different from the first period.
Public/Granted literature
- US20220373618A1 MEASUREMENT APPARATUS, CONTROL METHOD FOR MEASUREMENT APPARATUS, AND MEASUREMENT SYSTEM Public/Granted day:2022-11-24
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