Invention Grant
- Patent Title: Automated monitoring using image analysis
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Application No.: US17482040Application Date: 2021-09-22
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Publication No.: US12165302B2Publication Date: 2024-12-10
- Inventor: Bijan SayyarRodsari , Wei Dai , Alexander N. Berman , Kadir Liano
- Applicant: Rockwell Automation Technologies, Inc.
- Applicant Address: US OH Mayfield Heights
- Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee Address: US OH Mayfield Heights
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G05B19/4155 ; G05B19/418 ; G06F18/21 ; G06F18/2431 ; G06N20/00

Abstract:
A non-transitory computer-readable medium comprising computer-executable instructions that, when executed, are configured to cause a processor to perform operations that include receiving image data after an operation is performed by an industrial automation device on a product; analyzing the image data based an object-based image analysis (OBIA) model to classify the product as one of a plurality of conditions related to manufacturing quality and the OBIA model includes property layers associated with features related to a manufacturing of the product; determining whether the one of the conditions indicates an anomaly being present in the product; sending a notification indicative of the one of the plurality of conditions is presently associated with the product; identifying a property layer associated with classifying the one of the plurality of conditions; and updating the OBIA model based on the property layer and the input indicative of the anomaly being incorrectly associated with the product.
Public/Granted literature
- US20230092247A1 AUTOMATED MONITORING USING IMAGE ANALYSIS Public/Granted day:2023-03-23
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