Invention Grant
- Patent Title: Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the same
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Application No.: US17180343Application Date: 2021-02-19
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Publication No.: US12165933B2Publication Date: 2024-12-10
- Inventor: Inkeun Baek , Namil Koo , Suhwan Park , Junbum Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2020-0095798 20200731
- Main IPC: H01L21/66
- IPC: H01L21/66 ; G01N21/95 ; G01N21/956 ; H01L21/683

Abstract:
A semiconductor substrate processing apparatus includes: a metastructure layer divided into a plurality of microstructures by grooves, a light-transmitting dielectric substrate that supports the plurality of microstructures and is configured to allow an electromagnetic wave to be transmitted therethrough, and a frame including an exhaust hole configured to receive gas introduced from the grooves such as to provide suction force to the semiconductor substrate, wherein each of the plurality of microstructures has a smaller width than a wavelength of the electromagnetic wave, and each of the grooves has a smaller width than the wavelength of the electromagnetic wave.
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Information query
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