Invention Grant
- Patent Title: Semiconductor device and inspection method
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Application No.: US17584673Application Date: 2022-01-26
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Publication No.: US12169216B2Publication Date: 2024-12-17
- Inventor: Tsuyoshi Tachi
- Applicant: ROHM CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ROHM CO., LTD.
- Current Assignee: ROHM CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: HSML P.C.
- Priority: JP2021-014913 20210202
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01L23/00 ; H01L23/31 ; H01L23/495

Abstract:
A semiconductor device includes: a semiconductor element having an element main surface and first and second electrodes arranged on the element main surface; a first lead mounting the semiconductor element thereon; a second lead electrically connected to the first electrode; a third lead electrically connected to the second electrode; first connecting portions bonded to the first electrode and the second lead; and a sealing resin covering the semiconductor element, wherein the sealing resin includes a resin main surface facing the same side as the element main surface and a resin side surface connected to the resin main surface, the second lead includes a portion exposed from the sealing resin, the third lead includes a portion exposed from the sealing resin, and the exposed portion of the second lead includes a portion located on a side of the resin main surface with respect to the exposed portion of the third lead.
Public/Granted literature
- US20220244305A1 SEMICONDUCTOR DEVICE AND INSPECTION METHOD Public/Granted day:2022-08-04
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