Invention Grant
- Patent Title: Defect detection for additive manufacturing systems
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Application No.: US18512691Application Date: 2023-11-17
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Publication No.: US12172371B2Publication Date: 2024-12-24
- Inventor: Vivek R. Dave , R. Bruce Madigan , Mark J. Cola , Martin S. Piltch
- Applicant: DIVERGENT TECHNOLOGIES, INC.
- Applicant Address: US CA Los Angeles
- Assignee: DIVERGENT TECHNOLOGIES, INC.
- Current Assignee: DIVERGENT TECHNOLOGIES, INC.
- Current Assignee Address: US CA Los Angeles
- Agency: FisherBroyles, LLP
- Main IPC: B29C64/153
- IPC: B29C64/153 ; B22F10/28 ; B22F10/31 ; B22F10/38 ; B22F12/44 ; B22F12/49 ; B22F12/90 ; B29C64/393 ; B33Y10/00 ; B33Y30/00 ; B33Y40/00 ; B33Y50/02 ; B22F3/24 ; B22F10/12 ; B22F10/18 ; B22F10/25 ; B22F10/368

Abstract:
This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
Public/Granted literature
- US20240092016A1 DEFECT DETECTION FOR ADDITIVE MANUFACTURING SYSTEMS Public/Granted day:2024-03-21
Information query
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